The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2021
Filed:
Nov. 06, 2018
Micron Technology, Inc., Boise, ID (US);
Francis Chew, Boulder, CO (US);
Bruce A. Liikanen, Berthoud, CO (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A memory profiling system can generate profiles for target memory units of a memory component during runtime of the memory component. The memory profiling system can identify target memory units based on trigger conditions such as memory units crossing a specified depth in error recovery, receipt of a vendor specific (VS) command, memory unit retirement, or excessive background scan rates. In some cases, the memory profiling system can identify additional target memory units that are related to identified target memory units. The characterization processes can include computing voltage threshold (vt) distributions, Auto Read Calibration (ARC) analysis, Continuous Read Level Calibration (cRLC) analysis, DiffEC metrics, or gathering memory component metrics. The memory profiling system can store the generated profiles and can utilize the generated profiles to adjust operating parameters of one or more memory elements of the memory device, in real time.