The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Oct. 15, 2018
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

U N Vasudev, Bengaluru, IN;

Gajendra Kumar Patro, Bengaluru, IN;

Krishna N H Sri, Bengaluru, IN;

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/14 (2006.01);
U.S. Cl.
CPC ...
G01R 33/14 (2013.01);
Abstract

A test and measurement instrument, comprising at least one port configured to receive a signal from a device under test; a user interface configured to receive a user input, the user input indicating magnetic properties of a magnetic material of the device under test, and one or more processors. The one or more processors are configured to generate a hysteresis loop mask based on the magnetic properties of the magnetic material, determine whether the signal received from the device under test violates the hysteresis loop mask, and generate an alert when the signal received from the device under test violates the hysteresis loop mask. The test and measurement instrument may also include a display configured to display the hysteresis loop mask, the signal received from the device under test, and/or the alert.


Find Patent Forward Citations

Loading…