The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2021

Filed:

Mar. 21, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kazunari Fujii, Tokyo, JP;

Naoki Isoda, Tokyo, JP;

Toshio Negishi, Yokohama, JP;

Wataru Endo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01); H01L 23/525 (2006.01); H01L 49/02 (2006.01); H01L 27/06 (2006.01); H01L 27/112 (2006.01); G11C 17/16 (2006.01); B41J 2/175 (2006.01); B41J 2/14 (2006.01); B41J 2/145 (2006.01); B41J 29/38 (2006.01); G11C 17/18 (2006.01);
U.S. Cl.
CPC ...
B41J 2/04541 (2013.01); B41J 2/0458 (2013.01); B41J 2/04511 (2013.01); B41J 2/04543 (2013.01); B41J 2/04586 (2013.01); B41J 2/14 (2013.01); B41J 2/145 (2013.01); B41J 2/17513 (2013.01); B41J 29/38 (2013.01); G11C 17/165 (2013.01); G11C 17/18 (2013.01); H01L 23/5252 (2013.01); H01L 27/0629 (2013.01); H01L 27/11206 (2013.01); H01L 28/20 (2013.01); B41J 2002/14491 (2013.01); B41J 2202/13 (2013.01); B41J 2202/17 (2013.01);
Abstract

An apparatus includes a substrate, a transistor provided on the substrate and connected to a first terminal supplied with a first voltage, an anti-fuse element provided on the substrate and connected between the transistor and a second terminal supplied with a second voltage, a first resistive element provided on the substrate and connected in parallel to the anti-fuse element and between the transistor and the second terminal, and an adjusting unit provided on the substrate and configured to function so as to reduce an influence of variation in resistance of the first resistive element in reading out of information from the anti-fuse element.


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