The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2021

Filed:

Aug. 29, 2019
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventor:

Kaoru Miyata, Ibaraki, JP;

Assignee:

MITUTOYO CORPORATION, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 7/70 (2017.01); G06T 7/60 (2017.01); G01B 11/25 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/25 (2013.01); G06T 7/0002 (2013.01); G06T 7/60 (2013.01); G06T 7/70 (2017.01); G01B 11/2513 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A three-dimensional geometry measurement apparatus includes: a projection part that projects a projection image onto an object to be measured; an image capturing part that generates a captured image by capturing the object to be measured on which the projection image is projected; a relationship identification part that identifies a projection pixel position having correspondence with a captured pixel position; and a defective pixel determination part that determines whether the pixel at the captured pixel position is a defective pixel on the basis of a positional relationship between a projection light beam starting from the projection part and passing through the pixel at the projection pixel position and a captured light beam starting from the image capturing part and passing through the pixel at the captured pixel position having correspondence.


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