The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Mar. 25, 2020
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Rodion Vladimirovich Melnikov, Modiin, IL;

Amit Metodi, Petah-Tikva, IL;

Samer Raed Alqassis, Bethlehem, IL;

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3323 (2020.01); G06F 30/31 (2020.01); G06F 111/04 (2020.01); G06F 119/12 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3323 (2020.01); G06F 30/31 (2020.01); G06F 2111/04 (2020.01); G06F 2119/12 (2020.01);
Abstract

Aspects of the present disclosure address systems and methods for functional coverage in integrated circuit (IC) designs utilizing arbitrary expression to define irrelevant domains in coverage item definitions. A coverage item definition is determined to include an arbitrary expression that defines an irrelevant domain for a coverage item in a functional coverage analysis of an IC design. Based on determining if the item definition comprises the arbitrary expression, a verification the arbitrary expression satisfies one or more analyzability conditions is performed. Based on verifying the arbitrary expression satisfies the one or more analyzability conditions, the irrelevant domain for the coverage item is calculated based on the arbitrary expression. An enhanced functional coverage model that excludes the irrelevant domain for the coverage item is generated and used to perform the functional coverage analysis on the IC design.


Find Patent Forward Citations

Loading…