The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Apr. 08, 2020
Applicant:

Realtek Semiconductor Corporation, Hsinchu, TW;

Inventors:

Ying-Chieh Chen, Hsinchu, TW;

Mei-Li Yu, Hsinchu, TW;

Yu-Lan Lo, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/30 (2020.01); G06F 30/33 (2020.01);
U.S. Cl.
CPC ...
G06F 30/33 (2020.01);
Abstract

The present disclosure discloses a glitch occurring point detection method to detect at least one glitch occurring point in an under-test circuit that includes the steps outlined below. An IC design file is retrieved to further retrieve a plurality of input nodes, at least one output node and a plurality of power nodes corresponding to the under-test circuit in the IC design file. Signals are fed to the input nodes and the power nodes such that a DC analysis is performed on a plurality of internal circuit nodes in the under-test circuit and a plurality of candidate floating points that do not have any charging or discharging path connected thereto are retrieved according to the DC analysis. Each of the candidate floating points capable of triggering the output node during the operation of the under-test circuit are determined to be the glitch occurring point.


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