The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Oct. 25, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Michael Sheperek, Longmont, CO (US);

Bruce A. Liikanen, Berthoud, CO (US);

Larry J. Koudele, Erie, CO (US);

James P. Crowley, Longmont, CO (US);

Stuart A. Bell, Fort Collins, CO (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 3/0673 (2013.01); G06F 11/0727 (2013.01); G06F 11/0793 (2013.01);
Abstract

Feedback relating to errors in memory operations on a plurality of memory cells is received by a memory sub-system. At least one processing level corresponding to a program distribution is updated based on the feedback to adjust an error measure between pages of the plurality of memory cells and to adjust a read window budget within a page of the plurality of cells. The updating of the at least one processing level is based on information for the at least one processing level that is stored in a data-structure.


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