The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2020

Filed:

Jul. 24, 2017
Applicant:

Nidec-read Corporation, Kyoto, JP;

Inventor:

Norihiro Ota, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 3/00 (2006.01); G01R 31/28 (2006.01); G01R 31/50 (2020.01);
U.S. Cl.
CPC ...
G01R 1/07378 (2013.01); G01R 1/073 (2013.01); G01R 1/07314 (2013.01); G01R 3/00 (2013.01); G01R 31/28 (2013.01); G01R 31/50 (2020.01);
Abstract

This inspection jig is provided with: a plurality of probes (Pr) for bringing leading end portions (Pra) thereof into contact with a plurality of inspection points on a substrate (); a support member () that supports the probes (Pr) in a state wherein the leading end portions (Pra) are disposed to be in contact with the inspection points on the substrate () respectively; device-side connecting terminals () electrically connected to an inspection device main body (); a plurality of standard disposition electrodes (), which are conducted to the device-side connecting terminals (), and are disposed in previously set standard disposition; and a conversion block (), which has a first surface () and a second surface () on sides opposite to each other, and in which first electrodes (E) are formed on the first surface (), and in which second electrodes (E) are formed on the second surface ().


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