The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2020

Filed:

Feb. 26, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Hao Xu, Tokyo, JP;

Hiroshige Uchida, Tokyo, JP;

Shigeru Nakamoto, Tokyo, JP;

Kousuke Fukuchi, Tokyo, JP;

Satomi Inoue, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3065 (2006.01); H01J 37/22 (2006.01); H01J 37/32 (2006.01); H01L 21/02 (2006.01); H01L 21/768 (2006.01); H01L 21/3213 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01L 21/3065 (2013.01); H01J 37/226 (2013.01); H01J 37/32082 (2013.01); H01J 37/32715 (2013.01); H01L 21/0234 (2013.01); H01L 21/02315 (2013.01); H01L 21/02348 (2013.01); H01L 21/32136 (2013.01); H01L 21/76826 (2013.01); H01L 21/76862 (2013.01); H01J 2237/3343 (2013.01); H01L 21/67069 (2013.01);
Abstract

A plasma processing apparatus includes: a processing chamber in which a sample is subjected to plasma treatment; a radio frequency power supply configured to supply radio frequency power that generates plasma; a sample stage on which the sample is placed; and an ultraviolet light source configured to apply an ultraviolet ray. The apparatus further includes a controller configured to control the ultraviolet light source such that before the radio frequency power is supplied into the processing chamber, a pulse-modulated ultraviolet ray is applied into the processing chamber.


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