The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2020

Filed:

Mar. 22, 2019
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Risako Miyoshi, Miyagi, JP;

Norihiko Amikura, Miyagi, JP;

Kazuyuki Miura, Miyagi, JP;

Hiroshi Yazaki, Miyagi, JP;

Yasuhiro Shoji, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D 7/00 (2006.01); G01F 15/00 (2006.01); G01F 1/34 (2006.01);
U.S. Cl.
CPC ...
G05D 7/00 (2013.01); G01F 1/34 (2013.01); G01F 15/002 (2013.01); G01F 15/005 (2013.01);
Abstract

A substrate processing system includes a substrate processing apparatus and a measurement apparatus. The substrate processing apparatus includes a gas supply unit. The gas supply unit includes a flow rate controller and a secondary valve. The secondary valve is connected to a secondary side of the flow rate controller. The secondary valve is opened when a voltage is output from a first controller of the substrate processing system through a wiring. The measurement apparatus measures the flow rate of the gas output from the flow rate controller according to the instruction from the first controller. The measurement apparatus includes a second controller. The measurement apparatus includes a relay provided on the wiring. The second controller is configured to control the relay.


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