The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2020
Filed:
Mar. 22, 2017
Applicant:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA (US);
Inventors:
Zhifeng Huang, Pleasanton, CA (US);
Thomas A. Case, Walnut Creek, CA (US);
Lourens B. Steger, Pleasanton, CA (US);
Assignee:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/087 (2018.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/087 (2013.01); G01N 23/046 (2013.01); G01N 2223/309 (2013.01); G01N 2223/3032 (2013.01); G01N 2223/313 (2013.01); G01N 2223/401 (2013.01); G01N 2223/418 (2013.01); G01N 2223/419 (2013.01);
Abstract
A spectrum measurement and estimation method for tomographic reconstruction, beam hardening correction, dual-energy CT and system diagnosis, etc., comprises determining the spectra for combinations of source acceleration voltage, pre-filters and/or detectors and after measuring the transmission values of several pre-filters, calculating corrected spectra for the combinations of the source acceleration voltage, pre-filters and/or detectors.