The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Feb. 14, 2019
Anritsu Corporation, Kanagawa, JP;
Yoshitaka Kihara, Kanagawa, JP;
Takahiro Kasagi, Kanagawa, JP;
Custodio Jean-Elaine Garcia, Kanagawa, JP;
Yuichi Tsuiki, Kanagawa, JP;
ANRITSU CORPORATION, Kanagawa, JP;
Abstract
A measurement device and a measurement method capable of performing measurement on a device under test while maintaining a desired high data rate even under poor communication conditions such as occurrence of retransmission of a frame from a device under test in a wireless communication connection are provided. The measurement device includes a reception unitthat receives a frame transmitted from a DUT, a determination unitthat determines whether or not a header of the frame has been normally received by the reception unit, an acknowledgment transmission unitthat transmits the acknowledgment frame to the DUTwhen the determination unitdetermines that the header has been normally received by the reception unit; and a measurement unitthat performs the measurement on the frame determined by the determination unitthat the header has been normally received by the reception unit