The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Aug. 30, 2016
Method of measuring temperature of an object to be measured, dust temperature and dust concentration
Mitsubishi Materials Corporation, Tokyo, JP;
Ube Industries, Ltd., Yamaguchi, JP;
Sumitomo Osaka Cement Co., Ltd., Tokyo, JP;
Taiheiyo Cement Corporation, Tokyo, JP;
Hirokazu Shima, Ibaraki, JP;
Yoshiaki Takata, Ibaraki, JP;
MITSUBISHI MATERIALS CORPORATION, Tokyo, JP;
UBE INDUSTRIES, LTD., Yamaguchi, JP;
SUMITOMO OSAKA CEMENT CO., LTD., Tokyo, JP;
TAIHEIYO CEMENT CORPORATION, Tokyo, JP;
Abstract
A first radiance meter is directed toward an object to be measured, radiance is measured through a space where dust is present with the use of at least two wavelengths by the first radiance meter, second radiance meters which are equal in number to one or more objects having temperatures different from that of the object to be measured are directed toward the objects, radiances are measured through the space with the use of at least two wavelengths by the second radiance meters respectively, and a temperature of the object to be measured, a temperature of the dust, and concentration of the dust are measured from the radiances measured by the first radiance meter and the second radiance meters.