The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Oct. 10, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Gyu-Hee Park, Hwaseong-si, KR;

Yangsun Park, Hwaseong-si, KR;

Jaesoon Lim, Seoul, KR;

Younjoung Cho, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 16/20 (2006.01); C23C 16/455 (2006.01); C23C 16/08 (2006.01); H01L 29/78 (2006.01); H01L 21/02 (2006.01); H01L 29/66 (2006.01); H01L 21/3213 (2006.01); H01L 21/762 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0228 (2013.01); C23C 16/08 (2013.01); C23C 16/20 (2013.01); C23C 16/45534 (2013.01); H01L 21/32133 (2013.01); H01L 21/76224 (2013.01); H01L 29/66545 (2013.01);
Abstract

A method of fabricating a semiconductor device, the method including forming semiconductor patterns on a substrate such that the semiconductor patterns are vertically spaced apart from each other; and forming a metal work function pattern to fill a space between the semiconductor patterns, wherein forming the metal work function pattern includes performing an atomic layer deposition (ALD) process to form an alloy layer, and the ALD process includes providing a first precursor containing an organoaluminum compound on the substrate, and providing a second precursor containing a vanadium-halogen compound on the substrate.


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