The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
May. 17, 2018
Micron Technology, Inc., Boise, ID (US);
Kevin R. Brandt, Boise, ID (US);
William C. Filipiak, Boise, ID (US);
Michael G. McNeeley, Boise, ID (US);
Kishore K. Muchherla, Fremont, CA (US);
Sampath K. Ratnam, Boise, ID (US);
Akira Goda, Boise, ID (US);
Todd A. Marquart, Boise, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Performing a first set of scans on a memory device in a memory system with a first time interval between each scan of the first set of scans to detect errors on the memory device, determining, from performing the first set of scans, that a rate of errors being detected on the memory device is changing, and performing a second set of scans with a second time interval between each scan of the second set of scans to detect errors on the memory device, in response to determining that the rate of errors being detected on the memory device is changing, wherein the second time interval is different than the first time interval.