The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Jan. 09, 2019
Inficon Gmbh, Cologne, DE;
Silvio Decker, Cologne, DE;
Daniel Wetzig, Cologne, DE;
Hjalmar Bruhns, Bonn, DE;
Stefan Mebus, Cologne, DE;
Inficon GMBH, Cologne, DE;
Abstract
A method for leak detection of a test specimen includes providing an evacuable film test chamber which is operatively coupled to a pressure measuring device, and at least one processor operatively coupled to the pressure measuring device; measuring a pressure within the evacuable film test chamber by the pressure measuring device at predetermined times during a measurement period of time; calculating by the processor, a first or higher order derivative of a pressure change with respect to time at a first predetermined time, and a first or higher order derivative of a pressure change with respect to time at least at a second predetermined time during the measurement period of time, to provide at least a pair of derivative values; and categorizing by the processor a leaky or tight state of the specimen under test by a pattern recognition process based on the pair of derivative values.