The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Dec. 29, 2017
Applicant:

Spin Memory, Inc., Fremont, CA (US);

Inventors:

Mustafa Pinarbasi, Fremont, CA (US);

Thomas Boone, Fremont, CA (US);

Pirachi Shrivastava, Fremont, CA (US);

Pradeep Manandhar, Fremont, CA (US);

Assignee:

Spin Memory, Inc., Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 43/12 (2006.01); H01L 43/08 (2006.01); H01L 21/308 (2006.01); H01L 27/22 (2006.01); H01L 21/3065 (2006.01); H01L 43/02 (2006.01);
U.S. Cl.
CPC ...
H01L 43/12 (2013.01); H01L 21/308 (2013.01); H01L 21/3065 (2013.01); H01L 27/222 (2013.01); H01L 27/228 (2013.01); H01L 43/02 (2013.01); H01L 43/08 (2013.01);
Abstract

Embodiments of the present invention facilitate efficient and effective increased memory cell density configuration. In one embodiment, the method comprises: forming a first pitch reference component and a second pitch reference component; forming a first pillar magnetic tunnel junction (pMTJ) located in a first level and a second pMTJ located in a second level, wherein the location of the second pMTJ with respect to the first pMTJ is coordinated based upon a reference pitch distance between the first pitch reference component and first pitch reference component. In one exemplary implementation, the first pitch reference component is a first switch coupled to the first pMTJ and the second pitch reference component is a second switch coupled to the second pMTJ. The reference component size can be based upon a minimum lithographic processing dimension.


Find Patent Forward Citations

Loading…