The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Jul. 16, 2018
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method of recording an image using a particle microscope includes recording of plural images of an object. Each of the recorded images is associated with image data including intensity values associated with locations in a coordinate system of the recorded image. The method further includes: determining displacements between the coordinate systems of the image data of the recorded images; determining a bounding box of a resulting image based on the determined displacements; and calculating image data of the resulting image based on the intensity values of the image data of the recorded images associated with those locations which are located within the determined bounding box associated with the resulting image based on the determined displacements of the recorded images.