The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
May. 25, 2019
Applicant:
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;
Inventors:
Assignee:
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD, Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); H03M 13/19 (2006.01); G01N 35/00 (2006.01); G06F 11/07 (2006.01); H03M 13/15 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1048 (2013.01); G01N 35/00594 (2013.01); G01N 35/00732 (2013.01); G06F 11/073 (2013.01); G11C 29/50 (2013.01); H03M 13/1575 (2013.01); H03M 13/19 (2013.01); G01N 2035/00782 (2013.01); G11C 2029/5002 (2013.01);
Abstract
A memory device is provided. The memory device includes a memory array including a plurality of sections, and an inter-hamming difference analyzer. Each of the sections has an individual location in the memory array. The inter-hamming difference analyzer is configured to obtain a plurality of inter-hamming differences according to the number of unlike bits between content of each section of the plurality of sections corresponding to a first operating condition and content of another section of the plurality of sections corresponding to a second operating condition.