The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

May. 01, 2018
Applicant:

Carl Zeiss Smt Gmbh, Oberkochen, DE;

Inventor:
Assignee:

Carl Zeiss SMT GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G02B 5/122 (2006.01); G02B 17/00 (2006.01); G02B 19/00 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70258 (2013.01); G02B 5/122 (2013.01); G02B 17/004 (2013.01); G02B 19/0047 (2013.01); G02B 19/0095 (2013.01); G02B 27/0068 (2013.01); G03F 7/70316 (2013.01); G03F 7/70825 (2013.01);
Abstract

A microlithographic projection exposure apparatus optical 22 system includes a first reflective surface and at least one second reflective surface, each in the optical beam path. The first reflective surface is movable for the correction of an aberration that occurs during the operation of the optical system. The optical system is configured in so that, during the travel movement of the first reflective surface, the relative position of the first reflective surface and of the second reflective surface is maintainable in a stable manner. Either the first reflective surface and the second reflective surface directly succeed one another in the optical beam path, or there are only reflective optical elements between the first reflective surface and the second reflective surface.


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