The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Dec. 15, 2017
Carl Zeiss Microscopy Gmbh, Jena, DE;
Susan Candell, Lafayette, CA (US);
Thomas Anthony Case, Walnut Creek, CA (US);
Lorenz Lechner, Dublin, CA (US);
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method of operating a microscope comprises recording a first image Iof a sample, wherein the first image contains a first feature F; recording a second image Iof the sample, wherein the second image contains a second feature Farranged at a distance from the first feature; displacing the sample relative to the microscope by a displacement; recording a third image Iof the sample, wherein the third image contains the second feature; recording a fourth image Iof the sample, wherein the fourth image contains a third feature Farranged at a distance from the second feature; and determining a positionof the third feature relative to the first feature based on the first, second, third and fourth images.