The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Jan. 09, 2019
Applicant:

Nxp Usa, Inc., Austin, TX (US);

Inventors:

Fei Chen, Shanghai, CN;

Li Wang, Suzhou, CN;

Gang Li, Shanghai, CN;

Dengyu Jiang, Suzhou, CN;

Dechang Wang, Suzhou, CN;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02J 7/00 (2006.01); H02J 50/60 (2016.01); H02J 7/02 (2016.01); G01R 27/26 (2006.01); H02M 7/5387 (2007.01); H02J 50/12 (2016.01);
U.S. Cl.
CPC ...
H02J 50/60 (2016.02); G01R 27/2688 (2013.01); H02J 7/025 (2013.01); H02J 50/12 (2016.02); H02M 7/5387 (2013.01);
Abstract

In a wireless charging system, a power-transmitting node (TX) has a power transmitter for transmitting power wirelessly to a power-receiving node (RX), a sampling and sensing circuit, a processor, and a signal receiver for receiving signals from the RX. The processor detects the presence of a foreign object (FO) during a power-transfer session using Quality Factor (QF) values. Estimated QF parameters are determined via exponential curve fitting using peak values of a damped sinusoidal waveform generated by a resonant circuit. Then the estimated parameters in the exponential curve are used to calculate the QF, which provides a robust measurement result even in a noisy environment.


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