The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Nov. 03, 2017
Applicant:

Brown University, Providence, RI (US);

Inventors:

Christoph Rose-Petruck, Providence, RI (US);

Brian Sheldon, Brookline, MA (US);

Alexandra Stephan, Providence, RI (US);

Ravi Kumar, Providence, RI (US);

Francicso Schunk, Providence, RI (US);

Assignee:

BROWN UNIVERSITY, Providence, RI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 10/42 (2006.01); G01N 23/20025 (2018.01); G01N 23/201 (2018.01); G01N 23/207 (2018.01);
U.S. Cl.
CPC ...
H01M 10/4285 (2013.01); G01N 23/201 (2013.01); G01N 23/20025 (2013.01); G01N 23/2076 (2013.01);
Abstract

A method and apparatus for in-situ x-ray scatter imaging of battery electrodes. An apparatus includes an X-ray source, a grid, the grid comprising stainless steel wires with uniform spacing, and a cell, the X-ray source directing a beam of energy through the metal grid and components of the cell, the cell blurring a previously sharp projection of grid wires on an image detector. A method includes providing a Spatial Frequency Heterodyne Imaging system, providing a grid, providing a cell, generating X-rays from the Spatial Frequency Heterodyne Imaging system that pass through components of the cell and the grid, and detecting a scatter image from the X-rays.


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