The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Dec. 23, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Yi Wu, San Jose, CA (US);

Shaojun Yao, Shangai, CN;

Yong Jiang, Shanghai, CN;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/557 (2017.01); H04N 13/271 (2018.01); H04N 13/218 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
G06T 7/557 (2017.01); H04N 13/218 (2018.05); H04N 13/271 (2018.05); G06T 2207/10052 (2013.01); H04N 2013/0081 (2013.01);
Abstract

A system for sub-pixel disparity estimation is described herein. The system includes a plenoptic camera, a memory, and a processor. The memory is configured to store imaging data. The processor is \coupled to the memory and the plenoptic camera. The processor is to obtain a plurality of sub-aperture views, select a subset of sub-aperture views as reference views for a disparity calculation, and calculate an integer disparity for the reference views. The processor is also to refine the integer disparity to sub-pixel disparity accuracy for the reference views and propagate the sub-pixel disparity from the reference views to other views of the plurality of sub-aperture views.


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