The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Dec. 06, 2017
Conti Temic Microelectronic Gmbh, Nuremberg, DE;
Sudhan Dhana Sekaran, Bamberg, DE;
Joerg Schrepfer, Tettau, DE;
Johannes Petzold, Kulmbach, DE;
Markus Friebe, Gefrees, DE;
Georg Arbeiter, Kueps, DE;
Peerayut Khongsab, Grebrunn, DE;
Conti Temic microelectronic GmbH, Nuremberg, DE;
Abstract
A device provides improved obstacle identification. A first camera acquires first vehicle image data and provides it to a processing unit. A second camera acquires and provides second vehicle image data. An image overlap region has at least a portion of the first vehicle image data and at least a portion of the second vehicle image data. The first and second vehicle image data extend over a ground plane and the image overlap region extends over an overlap region of the ground plane. The processing unit extracts first image features from the first vehicle image data and extracts second image features from the second vehicle image data. The processing unit projects the first and the second image features onto the ground plane. The processing unit produces at least one image of the surroundings, having either at least a portion of the first vehicle image data associated with the overlap region, or at least a portion of the second vehicle image data associated with the overlap region, based in part on the determination of first image features whose projections lie in the overlap region of the ground plane, and on second image features whose projections lie in the overlap region of the ground plane.