The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Nov. 22, 2017
Carl Zeiss Microscopy Gmbh, Jena, DE;
Michael Gögler, Wolfratshausen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A microscope for imaging an object, comprising a lens for imaging the object through an imaging beam path, a light source for generating illumination radiation, at least one optical element for coupling the illumination radiation into the imaging beam path such that a common beam path is formed between the optical element and the lens, wherein the imaging radiation path runs through the common beam path, and the illumination radiation is guided through the common beam path. The microscope also comprises a monitoring device for measuring an energy parameter of the illumination radiation, said monitoring device determining an energy parameter of radiation which is incident on the monitoring device, and a beam splitter device which is arranged in the common beam path upstream of the lens in the illuminating direction and couples measurement radiation out of the illumination radiation onto the monitoring device.