The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Jul. 24, 2018
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Yuki Endo, Tokyo, JP;

Aritomo Kikuchi, Tokyo, JP;

Shigeo Nakamura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01R 33/00 (2006.01); G01R 33/09 (2006.01); G01R 33/035 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0023 (2013.01); G01R 33/0005 (2013.01); G01R 33/0354 (2013.01); G01R 33/09 (2013.01); G01R 33/093 (2013.01); H01L 2224/04042 (2013.01); H01L 2224/45144 (2013.01); H01L 2924/00 (2013.01); H01L 2924/14 (2013.01);
Abstract

Provided is a magnetic sensor testing device capable of preventing performance of an electromagnet from greatly changing due to heat applied to a magnetic sensor. A magnetic sensor testing device includes electromagnetsandthat apply a magnetic field to a magnetic sensor, temperature regulatorsandthat regulate a temperature of the magnetic sensor by locally applying heat to the magnetic sensor, and a controller that controls the electromagnetsandand the temperature regulatorsand, in which the controller tests the magnetic sensor in a state in which the magnetic field is applied to the magnetic sensor by the electromagnetsandwhile the heat is applied to the magnetic sensor by the temperature regulatorsand


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