The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

May. 09, 2019
Applicant:

Siliconware Precision Industries Co., Ltd., Taichung, TW;

Inventors:

Bo-Siang Fang, Taichung, TW;

Cheng-Tsai Hsieh, Taichung, TW;

Kuan-Ta Chen, Taichung, TW;

Ying-Wei Lu, Taichung, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H04B 17/29 (2015.01); H01Q 3/26 (2006.01); H04B 17/10 (2015.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); H01Q 3/267 (2013.01); H04B 17/101 (2015.01); H04B 17/29 (2015.01);
Abstract

A testing fixture used in an antenna testing process is provided. A cover unit having a second antenna portion is arranged on a base unit configured for an electronic structure having a first antenna portion to be placed thereon. The cover unit includes a non-metal interposing portion configured for pressing the electronic structure to separate the second antenna portion from the first antenna portion. Therefore, when the antenna testing process is performed on the electronic structure, a metal shielding effect is avoided, and an over the air testing environment is provided.


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