The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
Jan. 24, 2017
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Stefan Kluckner, Berlin, DE;
Yao-Jen Chang, Princeton, NJ (US);
Terrence Chen, Princeton, NJ (US);
Benjamin S. Pollack, Jersey City, NJ (US);
Patrick Wissmann, Munich, DE;
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Abstract
A model-based method of inspecting a specimen for presence of an interferent (H, I, and/or L). The method includes capturing images of the specimen at multiple different exposures times and at multiple spectra having different nominal wavelengths, selection of optimally-exposed pixels from the captured images to generate optimally-exposed image data for each spectra, identifying a serum or plasma portion of the specimen, and classifying whether an interferent is present or absent within the serum or plasma portion. Testing apparatus and quality check modules adapted to carry out the method are described, as are other aspects.