The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Jun. 30, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Yiftach Gilad, Givat Ada, IL;

Ariel Szapiro, Kfar Neter, IL;

Elkana Korem, Tzoran, IL;

Alexander Gendler, kiriat motzkin, IL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/32 (2019.01); G06F 1/324 (2019.01); G06F 1/08 (2006.01); G06F 1/3296 (2019.01); H03K 5/133 (2014.01); H03K 19/003 (2006.01); G11C 29/02 (2006.01); G11C 7/22 (2006.01); G11C 5/14 (2006.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
G06F 1/324 (2013.01); G06F 1/08 (2013.01); G06F 1/3296 (2013.01); G11C 29/023 (2013.01); G11C 29/028 (2013.01); H03K 5/133 (2013.01); H03K 19/00323 (2013.01); G11C 5/14 (2013.01); G11C 7/222 (2013.01); H03K 2005/00019 (2013.01);
Abstract

Apparatus and methods are provided for improving yield and frequency performance of integrated circuit processors, such as multiple-core processors. In an example, an apparatus can include a plurality of clock buffers, each clock buffer of the plurality of clock buffers configured to receive a first clock signal and distribute a plurality of second clock signals, a one-time programmable locate critical path mechanism configured provide a plurality of indications to enable or disable a delay of each clock buffer of the plurality of clock buffers, and a power management control circuit configured to over-ride one or more of the plurality of indications in a first non-test mode of operation of the apparatus and to not over-ride the one or more indications in a second non-test mode of operation of the apparatus.


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