The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Aug. 10, 2016
Omron Corporation, Kyoto, JP;
Minoru Oka, Moriyama, JP;
Yoshiaki Kobayashi, Kawachinagano, JP;
Tatsuya Hirota, Kyoto, JP;
Naohiro Akiyama, Muko, JP;
OMRON Corporation, Kyoto, JP;
Abstract
Provided is a management system associated with a manufacturing line including one or more facilities. Each of the facilities is configured to process each workpiece according to order information. The management system includes: a collecting means for collecting event information about a process that takes place in each of the facilities; a classifying means for classifying, on the basis of a generation source and content of each piece of event information, the event information collected by the collecting means, into sets of event information generated due to the same workpiece; a generation means for generating data which represents process circumstances for each workpiece on the basis of the event information belonging to each of the sets classified by the classifying means; and a visualizing means for visualizing process progression circumstances for each workpiece processed according to the order information, on the basis of the data generated by the generating means.