The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Dec. 20, 2018
Applicant:

Ion Beam Applications S.a., Louvain-la-Neuve, BE;

Inventors:

Sébastien De Neuter, Louvain-la-Neuve, BE;

Jean-Michel Geets, Louvain-la-Neuve, BE;

Benoit Nactergal, Louvain-la-Neuve, BE;

Vincent Nuttens, Louvain-la-Neuve, BE;

Jarno Van De Walle, Louvain-la-Neuve, BE;

Assignee:

Ion Beam Application S.A., Louvain-la-Neuve, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05H 13/00 (2006.01); H05H 7/10 (2006.01);
U.S. Cl.
CPC ...
H05H 13/005 (2013.01); H05H 7/10 (2013.01);
Abstract

A cyclotron for accelerating a beam of charged particles and extracting the beam. The cyclotron includes a vacuum chamber; a target support element sealed and coupled to the vacuum chamber and including a tubular channel leading to a target; first energy specific extraction kit including a first stripper assembly with a stripper located at a first stripping position for stripping charged particles at a first energy and a second energy specific extraction kit for driving modified charged particles of second energy along a second extraction path towards a target holder, wherein the energy specific extraction kit includes: a second stripper assembly with a stripper located at a second stripping position for stripping charged particles at a second energy and an insert for modifying an orientation of the tubular channel to match the second extraction path such that the modified charged particles of second energy intercept the target holder.


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