The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Aug. 20, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Yeong Gil Kim, Hwaseong-gi, KR;

Han Seong Kim, Suwon-si, KR;

Jong Min Baek, Seoul, KR;

Ji Young Kim, Seoul, KR;

Sung Bin Park, Suwon-si, KR;

Deok Young Jung, Seoul, KR;

Kyu Hee Han, Hwaseong-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 21/311 (2006.01); H01L 21/02 (2006.01); H01L 23/522 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76835 (2013.01); H01L 21/022 (2013.01); H01L 21/02123 (2013.01); H01L 21/02126 (2013.01); H01L 21/31144 (2013.01); H01L 21/76822 (2013.01); H01L 21/76829 (2013.01); H01L 23/5226 (2013.01); H01L 23/53223 (2013.01); H01L 23/53295 (2013.01);
Abstract

A method of fabricating a semiconductor device is provided. The method may include forming a first interlayer insulating film on a substrate, forming a second interlayer insulating film on the first interlayer insulating film, and forming a third interlayer insulating film on the second interlayer insulating film. Different amounts of carbon may be present in each of the first, second, and third interlayer insulating films. The third interlayer insulating film may be used as a mask pattern to form a via trench that extends at least partially into the first interlayer insulating film and the second interlayer insulating film. Supplying a carbon precursor may be interrupted between the forming of the second and third interlayer insulating films, such that the second interlayer insulating film and the third interlayer insulating film may have a discontinuous boundary therebetween.


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