The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Feb. 07, 2017
Applicant:
Sony Corporation, Tokyo, JP;
Inventors:
Assignee:
SONY CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 5/00 (2006.01); A61B 5/026 (2006.01); G01P 5/26 (2006.01); G06T 7/246 (2017.01); A61B 5/1455 (2006.01); G01P 5/22 (2006.01); A61B 5/021 (2006.01); A61B 5/024 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02094 (2013.01); A61B 5/0033 (2013.01); A61B 5/0059 (2013.01); A61B 5/021 (2013.01); A61B 5/024 (2013.01); A61B 5/0261 (2013.01); A61B 5/14551 (2013.01); G01B 9/02083 (2013.01); G01P 5/22 (2013.01); G01P 5/26 (2013.01); G06T 7/246 (2017.01); G06T 2207/30104 (2013.01);
Abstract
There is provided a speckle measurement apparatus to improve accuracy of flow velocity measurement or the like of particulates such as erythrocytes, the speckle measurement apparatus including an imager that captures scattered light images returned from an object to be measured when the object to be measured is irradiated with coherent light as speckle images, and a controller that determines a measurement area that is the same site of the object to be measured in a plurality of the speckle images captured continuously in time series by the imager by incorporating a displacement amount of a relative positional relationship between the object to be measured and the imager.