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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10801831 B1

PDFFull Text
Date of Patent:
Oct. 13, 2020

Filed:

Feb. 07, 2017

Speckle measurement apparatus and speckle measurement method

Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Kota Aizawa, Tokyo, JP;

Atsushi Okubo, Tokyo, JP;

Yoshihiro Wakita, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:

Paratus Law Group, PLLC

Primary Examiner:

Diane D Mizrahi

Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 5/00 (2006.01); A61B 5/026 (2006.01); G01P 5/26 (2006.01); G06T 7/246 (2017.01); A61B 5/1455 (2006.01); G01P 5/22 (2006.01); A61B 5/021 (2006.01); A61B 5/024 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02094 (2013.01); A61B 5/0033 (2013.01); A61B 5/0059 (2013.01); A61B 5/021 (2013.01); A61B 5/024 (2013.01); A61B 5/0261 (2013.01); A61B 5/14551 (2013.01); G01B 9/02083 (2013.01); G01P 5/22 (2013.01); G01P 5/26 (2013.01); G06T 7/246 (2017.01); G06T 2207/30104 (2013.01);
Abstract

There is provided a speckle measurement apparatus to improve accuracy of flow velocity measurement or the like of particulates such as erythrocytes, the speckle measurement apparatus including an imager that captures scattered light images returned from an object to be measured when the object to be measured is irradiated with coherent light as speckle images, and a controller that determines a measurement area that is the same site of the object to be measured in a plurality of the speckle images captured continuously in time series by the imager by incorporating a displacement amount of a relative positional relationship between the object to be measured and the imager.

Find Patent Forward Citations

Aizawa, Kota. (2020). Speckle measurement apparatus and speckle measurement method (U.S. Patent No. 10801831). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10801831

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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