The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Mar. 09, 2018
Applicant:
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Inventors:
Yushi Tsubota, Tokyo, JP;
Kenichi Kawabata, Tokyo, JP;
Atsurou Suzuki, Tokyo, JP;
Takahide Terada, Tokyo, JP;
Wenjing Wu, Tokyo, JP;
Kazuhiro Yamanaka, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/15 (2006.01); A61B 8/08 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/5207 (2013.01); A61B 8/0825 (2013.01); A61B 8/15 (2013.01); A61B 8/4494 (2013.01); A61B 8/5269 (2013.01);
Abstract
A sinogram is corrected in a form that can use a straight-ray type reconstruction method while considering trajectory of refracted waves. Specifically, based on the sequentially estimated path information of the virtual waves, an arrival time difference sinogram is corrected by a difference or a ratio between 'shortest arrival time of wave' and 'arrival time of the wave through the shortest path' to each detection element.