The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Sep. 12, 2019
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Kazuya Ishibashi, Tokyo, JP;

Atsushi Narazaki, Tokyo, JP;

Yasuhiro Kagawa, Tokyo, JP;

Kensuke Taguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 29/16 (2006.01); H01L 29/417 (2006.01); H01L 29/10 (2006.01); H01L 29/08 (2006.01); H02M 1/08 (2006.01); H01L 29/45 (2006.01); H01L 49/02 (2006.01); H02M 7/5387 (2007.01);
U.S. Cl.
CPC ...
H01L 29/7806 (2013.01); H01L 28/20 (2013.01); H01L 29/0865 (2013.01); H01L 29/0882 (2013.01); H01L 29/1095 (2013.01); H01L 29/1608 (2013.01); H01L 29/41741 (2013.01); H01L 29/45 (2013.01); H01L 29/7803 (2013.01); H02M 1/08 (2013.01); H02M 7/53871 (2013.01);
Abstract

A drift layer contains first conductivity type impurities. A well region contains second conductivity type impurities. A source region is provided on the well region and contains the first conductivity type impurities. A well contact region is in contact with the well region, contains the second conductivity type impurities, and has an impurity concentration on the second surface higher than the impurity concentration on the second surface in the well region. A gate electrode is provided on a gate insulating film. A Schottky electrode is in contact with the drift layer. A source ohmic electrode is in contact with the source region. A resistor is in contact with the well contact region and has higher resistance per unit area than the source ohmic electrode.


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