The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Aug. 14, 2017
Applicant:

Eugene Technology Co., Ltd., Yongin-si, Gyeonggi-do, KR;

Inventors:

Doo Yeol Ryu, Cheongju-si, KR;

Seung Woo Shin, Hwaseong-si, KR;

Cha Young Yoo, Suwon-si, KR;

Woo Duck Jung, Suwon-si, KR;

Ho Min Choi, Yongin-si, KR;

Wan Suk Oh, Icheon-si, KR;

Hui Sik Kim, Yongin-si, KR;

Eun Ho Kim, Yongin-si, KR;

Seong Jin Park, Seoul, KR;

Assignee:

EUGENE TECHNOLOGY CO., LTD., Yongin-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 21/203 (2006.01); H01L 21/324 (2006.01); H01L 21/285 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/2018 (2013.01); H01L 21/02 (2013.01); H01L 21/20 (2013.01); H01L 21/203 (2013.01); H01L 21/285 (2013.01); H01L 21/324 (2013.01);
Abstract

Provided is a method for forming an epitaxial layer at a low temperature. The method for forming the epitaxial layer includes transferring a substrate into an epitaxial chamber and performing an epitaxial process on the substrate to form an epitaxial layer on the substrate. The epitaxial process includes heating the substrate at a temperature of about 700° C. or less and injecting a silicon gas into the epitaxial chamber in a state in which the inside of the epitaxial chamber is adjusted to a pressure of about 300 Torr or less to form a first epitaxial layer, stopping the injection of the silicon gas and injecting a purge gas into the epitaxial chamber to perform first purge inside the epitaxial chamber, heating the substrate at a temperature of about 700° C. or less and injecting the silicon gas into the epitaxial chamber in the state in which the inside of the epitaxial chamber is adjusted to a pressure of about 300 Torr or less to form a second epitaxial layer, and stopping the injection of the silicon gas and injecting the purge gas into the epitaxial chamber to perform second purge inside the epitaxial chamber.


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