The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Jun. 07, 2019
Applicant:

Nuflare Technology, Inc., Kanagawa, JP;

Inventors:

Yoshihiro Izumi, Yokohama, JP;

Hideki Ito, Kawasaki, JP;

Toshikatsu Akiba, Kisarazu, JP;

Assignee:

NUFLARE TECHNOLOGY, INC., Kanagawa, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/06 (2006.01); H01J 37/20 (2006.01); H01J 37/147 (2006.01);
U.S. Cl.
CPC ...
H01J 37/06 (2013.01); H01J 37/1472 (2013.01); H01J 37/20 (2013.01); H01J 2237/20228 (2013.01); H01J 2237/2448 (2013.01); H01J 2237/2817 (2013.01);
Abstract

According to one aspect of the present invention, a charged particle beam image acquisition apparatus includes a rectangular parallelepiped chamber where a target object is disposed; a primary electron optical column placed on an upper surface of the chamber so that a point of intersection between two diagonal lines on the upper surface of the chamber is located at a center of a horizontal section of the primary electron optical column, a primary charged particle beam optics irradiating the target object with a primary charged particle beam being disposed in the primary electron optical column; and a secondary electron optical column connected to a lower portion of the primary electron optical column, a secondary charged particle beam optics being disposed in the secondary electron optical column and a secondary charged particle beam passing through the secondary charged particle beam optics.


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