The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Sep. 28, 2018
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Lei Chen, Sunnyvale, CA (US);

Xin Guo, San Jose, CA (US);

Shu-Jen Lee, Folsom, CA (US);

Chu-hsiang Teng, Rancho Cordova, CA (US);

Scott Nelson, Vancouver, CA;

Donia Sebastian, Fair Oaks, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 29/02 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1012 (2013.01); G11C 16/26 (2013.01); G11C 16/3431 (2013.01); G11C 29/021 (2013.01); G11C 29/028 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/0411 (2013.01);
Abstract

Examples described herein can be used to reduce a number of re-read operations and potentially avoid data recovery operations, which can be time consuming. A determination can be made of a read voltage to apply during an operation to cause a read of data stored in a region of a memory device. The region of the memory device can be read using the read voltage. If the region is not successfully read, then an error level indication can be measured and a second read voltage can be determined for a re-read operation. If the re-read operation is not successful, then a second error level indication can be measured for the re-read operation. A third read voltage can be selected based on the change from the error level indication to the second error level indication.


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