The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Oct. 11, 2018
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventor:

Kyoji Shibuya, Kyoto, JP;

Assignee:

HORIBA. LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01); G01N 21/59 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/031 (2013.01); G01N 21/59 (2013.01); G01N 21/39 (2013.01); G01N 2201/0668 (2013.01);
Abstract

The present claimed invention makes it possible to simplify a structure of a multiple-reflection cell and to measure both a measuring objective component having a high concentration and a measuring objective component having a low concentration. The analysis device of this invention is to irradiate a light to a multiple-reflection cell into which a sample is introduced, to detect the light exiting from the multiple-reflection cell and to analyze a measuring objective component contained in the sample, and comprises a first light irradiation part that allows a first light to enter the multiple-reflection cell and a second light irradiation part that allows a second light to enter the multiple-reflection cell. The multiple-reflection cell has a pair of reflecting mirrors that reflect the first light and the second light.


Find Patent Forward Citations

Shibuya, Kyoji. (2020). Analysis device (U.S. Patent No. 10788415). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10788415

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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