The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Mar. 19, 2019
Applicant:

Powerchip Semiconductor Manufacturing Corporation;

Inventors:

Hung-Kwei Liao, Taoyuan, TW;

Chen-Chiang Liu, Hsinchu County, TW;

Kuo-Sheng Shih, Hsinchu, TW;

Yung-Yao Shih, Hsinchu, TW;

Ming-Tsung Hsu, Chiayi County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/265 (2006.01); H01L 21/28 (2006.01); H01L 21/311 (2006.01); H01L 21/321 (2006.01); H01L 21/8238 (2006.01); H01L 27/092 (2006.01); H01L 29/40 (2006.01); H01L 29/49 (2006.01); H01L 21/3215 (2006.01); H01L 21/027 (2006.01);
U.S. Cl.
CPC ...
H01L 27/092 (2013.01); H01L 21/0217 (2013.01); H01L 21/0274 (2013.01); H01L 21/02164 (2013.01); H01L 21/26513 (2013.01); H01L 21/28052 (2013.01); H01L 21/31116 (2013.01); H01L 21/31144 (2013.01); H01L 21/3212 (2013.01); H01L 21/32155 (2013.01); H01L 21/823835 (2013.01); H01L 21/823857 (2013.01); H01L 21/823878 (2013.01); H01L 29/401 (2013.01); H01L 29/4933 (2013.01);
Abstract

Provided is a semiconductor device including a substrate, an isolation structure, a barrier structure, a first conductive layer, a second conductive layer, a first gate dielectric layer, and a second gate dielectric layer. The substrate has a first region and a second region. The barrier structure is located on the isolation structure. The first conductive layer is located on the first region. The second conductive layer is located on the second region. The first gate dielectric layer is located between the first conductive layer and the substrate in the first region. The second gate dielectric layer is located between the second conductive layer and the substrate in the second region. The first gate dielectric layer and the second gate dielectric layer are separated by the isolation structure. A method of manufacturing the semiconductor device is also provided.


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