The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2020

Filed:

Dec. 28, 2018
Applicant:

Wuhan Xinxin Semiconductor Manufacturing Co., Ltd., Hubei, CN;

Inventors:

Tian Zeng, Hubei, CN;

Changlin Zhao, Hubei, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/48 (2006.01); H01L 27/06 (2006.01); H01L 21/288 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76898 (2013.01); H01L 21/2885 (2013.01); H01L 21/7684 (2013.01); H01L 21/76804 (2013.01); H01L 21/76877 (2013.01); H01L 23/481 (2013.01); H01L 27/0688 (2013.01);
Abstract

A multi-wafer stacking structure and a fabrication method thereof are disclosed. A first dielectric layer and a second dielectric layer are bonded to each other, a first interconnection layer is electrically connected with a second metal layer and a first metal layer via a first opening; a third dielectric layer and an insulating layer are bonded to each other, and a second interconnection layer is electrically connected with a third metal layer and the first interconnection layer via a second opening. Reservation of a pressure welding lead space among wafers is not needed, a silicon substrate is omitted, multi-wafer stacking thickness is reduced while interconnection of multiple pieces of wafers is realized, and therefore, the overall thickness of the device after multi-wafer stacking and packaging is reduced, packaging density is increased, and the requirement of thinning of the semiconductor products is met.


Find Patent Forward Citations

Zeng, Tian. (2020). Multi-wafer stacking structure and fabrication method thereof (U.S. Patent No. 10784163). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10784163

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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