The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2020
Filed:
May. 25, 2018
Applicant:
Nidec Read Corporation, Kyoto, JP;
Inventors:
Assignee:
NIDEC-READ CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); C25D 5/48 (2006.01); C25D 3/12 (2006.01); C25D 5/14 (2006.01); C25D 5/12 (2006.01); C25D 1/04 (2006.01); G01R 35/00 (2006.01); C23C 18/16 (2006.01); C23C 18/42 (2006.01); C25D 1/20 (2006.01); C25D 3/56 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06761 (2013.01); C25D 1/04 (2013.01); C25D 3/12 (2013.01); C25D 5/12 (2013.01); C25D 5/14 (2013.01); C25D 5/48 (2013.01); G01R 1/06722 (2013.01); G01R 35/00 (2013.01); C23C 18/1653 (2013.01); C23C 18/42 (2013.01); C25D 1/20 (2013.01); C25D 3/562 (2013.01);
Abstract
Provided is a contact probe which may achieve improved heat resistance even when a spring portion thereof is compressed and released in a high temperature environment. The contact probe includes an Ni—P layer, and the Ni—P layer has different concentrations of P at different positions in a thickness direction of the Ni—P layer.