The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2020

Filed:

Nov. 21, 2019
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Victor Moroz, Saratoga, CA (US);

Stephen Lee Smith, Mountain View, CA (US);

Yong-Seog Oh, Pleasanton, CA (US);

Michael C. Shaughnessy-Culver, Napa, CA (US);

Jie Liu, San Jose, CA (US);

Terry Sylvan Kam-Chiu Ma, Danville, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 30/398 (2020.01); G06F 16/245 (2019.01); G06F 30/20 (2020.01); G06F 30/36 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 16/245 (2019.01); G06F 30/20 (2020.01); G06F 30/36 (2020.01);
Abstract

A system for evaluating candidate materials for fabrication of integrated circuits includes a data processor coupled to a memory. Roughly described, the data processor is configured to: calculate and write to a first database, for each of a plurality of candidate materials, values for each property in a set of intermediate properties; calculate and write to a second database, values for a selected target property for various combinations of values for the intermediate properties and values describing candidate environments; and for a particular candidate material and a particular environment in combination, determine values for the intermediate properties for the candidate material by reference to the first database, and determine the value of the target property for the candidate material by querying the second database with, in combination, (1) the determined intermediate property values of the candidate material and (2) a value or values describing the particular environment.


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