The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2020
Filed:
Oct. 28, 2011
Lloyd K. Frick, Pepperell, MA (US);
David John Lind, North Andover, MA (US);
Lloyd K. Frick, Pepperell, MA (US);
David John Lind, North Andover, MA (US);
Teradyne, Inc., North Reading, MA (US);
Abstract
In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to a test instrument, and that is programmed to control operation of the test instrument, and a second processing system that is dedicated to device testing. The second processing system being programmable to run one or more test programs to test the device, and the first processing system has a first application programming interface (API) and the second processing system has a second API, the first API and the second API being different APIs, the first API and the second API having at least some duplicate functions.