The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Sep. 24, 2018
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Oscar Nestares, San Jose, CA (US);

Kalpana Seshadrinathan, San Jose, CA (US);

Vladan Popovic, Santa Clara, CA (US);

Horst Haussecker, Palo Alto, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); H04N 13/111 (2018.01); G06K 9/32 (2006.01); G11B 27/022 (2006.01); H04N 9/04 (2006.01); H04N 5/247 (2006.01); G11B 27/031 (2006.01);
U.S. Cl.
CPC ...
H04N 13/111 (2018.05); G06K 9/3233 (2013.01); G06T 7/70 (2017.01); G11B 27/022 (2013.01); G11B 27/031 (2013.01); H04N 5/247 (2013.01); H04N 9/045 (2013.01);
Abstract

Techniques related to generating a virtual view from multi-view images for presentation to a viewer are discussed. Such techniques include determining, based on a viewer position relative to a display region, first and second crop positions of planar image and cropping the planar image to a cropped planar image to fill the display region using the first and second crop positions such that the first and second crop positions define an asymmetric frustum between the cropped planar image and a virtual window corresponding to the display region.


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