The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Oct. 25, 2016
Carl Zeiss Microscopy Gmbh, Jena, DE;
Peter Schacht, Erfurt, DE;
Hubert Wahl, Stadtroda, DE;
Nils Langholz, Apolda, DE;
Tobias Hackel, Eisenach, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
The invention relates to a microscope () having an objective interchange apparatus () comprising a holder () for receiving a number of objectives () at respective holder positions () and an objective receptacle () which is configured for receiving an objective () and is arranged in an optical beam path () of the microscope (). The microscope () is characterized by an objective delivery device () which is configured for transporting in each case a selected objective () having an objective retainer () between its holder position (), which is delivered to a transfer position (ÜP), and the objective receptacle (), wherein the objective receptacle () remains in the optical beam path () during the transport of the objective (). The objective retainer () has an outer centering diameter () as a reference surface, which diameter is guided against a lateral reference surface located in the objective receptacle () such that a reproducible positioning perpendicular to an optical axis () of the microscope () may be achieved.