The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Jun. 16, 2017
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Bernd Laquai, Stuttgart, DE;

Stefan Gross, Herrenberg, DE;

Ingolf Martin, Balingen, DE;

Alfred Rosenkränzer, Herrenberg, DE;

Detlef Müller, Renningen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 31/3191 (2013.01); G01R 31/31908 (2013.01);
Abstract

A test equipment has a signal input/signal output and a use-site calibration unit for determining a user-site compensation function. The user-site compensation function has a compensation magnitude function and a compensation Hilbert phase function. The calibration unit has a level meter and a calculator. The level meter is configured to measure a magnitude characteristic of the electrical signal, the magnitude characteristic being the basis for the determination of the compensation Hilbert phase function. The calculator is configured to determine a Hilbert phase characteristic of the electrical signal based on a Hilbert transformation of a function dependent on the measured magnitude characteristic and to determine the compensation Hilbert phase function on the basis of the Hilbert phase characteristic.


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