The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Nov. 06, 2018
Rigaku Corporation, Akishima-shi, Tokyo, JP;
Shuichi Kato, Akishima, JP;
Yoshiyuki Kataoka, Takatsuki, JP;
Hajime Fujimura, Takatsuki, JP;
Takashi Yamada, Takatsuki, JP;
Rigaku Corporation, Akishima-shi, Tokyo, JP;
Abstract
A wavelength dispersive X-ray fluorescence spectrometer of the present invention includes: a position sensitive detector () configured to detect intensities of secondary X-rays () at different spectral angles, by using detection elements () corresponding to the secondary X-rays () at different spectral angles; a measured spectrum display unit () configured to display a relationship between a position, in an arrangement direction, of each detection element (), and a detected intensity by the detection element (), as a measured spectrum, on a display (); a detection area setting unit () configured to be set a peak area and a background area; and a quantification unit () configured to calculate, as a net intensity, an intensity of the fluorescent X-rays to be measured, based on a peak intensity in the peak area, a background intensity in the background area, and a background correction coefficient, and to perform quantitative analysis.