The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Apr. 28, 2017
Kyodo Yushi Co., Ltd., Fujisawa-shi, Kanagawa, JP;
Toray Engineering Co., Ltd., Chuo-ku, Tokyo, JP;
Yoichi Suzuki, Kameyama, JP;
Toshikazu Kawado, Kasaoka, JP;
Chisa Inaka, Otsu, JP;
Tatsuya Okada, Otsu, JP;
KYODO YUSHI CO., LTD., Fujisawa-shi, Kanagawa, JP;
TORAY ENGINEERING CO., LTD., Tokyo, JP;
Abstract
An inspection device () includes a light source () projecting excitation light to an inner surface of a container (); an imager () capturing a fluorescence image of fluorescence emitted from a foreign substance in response to the excitation light projected; and a detector () detecting the foreign substance adhering to the inner surface of the container from the fluorescence image captured by the imager. The foreign substance contains a material emitting fluorescence in response to the excitation light projected to the material. The detector includes a calculator () calculating an average brightness value in an inspection target region, and an adjuster () adjusting an image-capturing condition where the fluorescence image is captured such that the average brightness value falls within a preset range.